Mixed Signal Test Systems

Printable Version

System Description:
The MTS-1010i is a more economical version of the MTS-2010i & MTS-1020i testers. It has a reduced platform size and reduced power supplies. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
The MTS-1010i has a modular architecture that places all resources directly at the DUT board. Each resource contains a full system for measurement and sourcing. This permits real parallel testing of dual and quad devices by selecting the necessary cards. Any card may be placed on any of the 8 slots. One additional advantage of this architecture is that it makes it possible to use existing DUT boards from other test platforms by appropriately routing the connections on the DUT Board, making it possible to use existing hardware. The calibration methods used by the MTS1010i eliminate the errors introduced by the additional wiring and connections made when interfacing to existing Load Boards.
New Technology:
There are two principal technical innovations present on the MTS1010i: Zero Time Averaging™ (ZTA™), and Real Time Hardware Error Correction™ (HEC™). ZTA is a hardware implementation that greatly improves the time to make measurements. With this hardware, it is possible to obtain the same repeatability obtained by averaging 20 measurements but only take the time for a single measurement. HEC allows the tester to actually achieve the accuracy, when forcing or measuring a parameter, of the calibration standard used when the resource was calibrated.

The use of ZTA, HEC, as well as onboard controllers on each of the resources results in the MTS-1010 achieving very fast test times, while actually increasing the accuracy of the results.

The final result of all this is much lower test costs and higher test yields.

The MTS1010 can interface to any prober/handler that has either a parallel, IEE488/GPIB/HPIB, or RS232 Serial interface. The software has a very user friendly Graphical interface that permits easy configuration & driver creation In addition, the handler port allows connection of up to three handlers simultaneously for full Parallel Operation, allowing for a virtual no-index time testing.
System Software:
The system software is WINDOWS-NT/2000/XP* based. It is very powerful, and secure, while maintaining the user-friendly environment of the WINDOWS operating systems. The operator interface was created so that any person familiar with programs like WORD, EXCEL, Power Point, or other Windows software, would be able to operate the tester in a mater of a few minutes.

The Engineering interface uses Visual C++ from Microsoft. This development environment is very widely used and very easy to learn, while providing very powerful control capability over the tester.

System Resources:
There are two types of resources available: General Purpose System Resources, and Device Family Specific Resources. General Purpose System Resources are design to be used for testing a wide variety of devices from different family types. They contain a high degree of flexibility and capability. Device Specific Family Resources are optimized for a specific family of parts. They are fully integrated resources that contain all the sub-modules necessary to test a particular family of devices. They bring a high degree of cost effectiveness and efficiency to testing the family of devices they are targeted for.
* Microsoft, Windows NT, Windows 2000, Windows XP, Visual C++ are registered trademarks of Microsoft Corporation

System Specifications:









Input Voltage - AC (Note 1) Jumper selectable 90 100 105  
108 120 125 VAC
200 220 230  
215 240 250  
Input Frequency AC Input 47   63 Hz
Line Regulation Output Voltage charge for 10%
line change F case models
-0.01   0.01  
Input Current       20 Amps








Ambient Operating Temperature Functional



35 șC
Within specification 20 25 28 șC
Storage Temperature   -40   85 șC
Relative Humidity Non-condensing 10%   90%  
* Note 1: AC must be free or voltage transients. A high quality Power Line Conditioner may be required for equipment using high current and or high level transients present on AC line.






75 Kg

100 Kg


0.68 m

0.97 m


0.30 m

0.72 m


0.49 m

0.66 m

System Resources:
IC Family Specifications Resources
PFM1010 - Power Mosfet test Module. 50 V / 50 A Pulse power for 1 mS capability. Rdson Measurement capability to an accuracy ± 1% and a resolution of 1 uOhm.
QOAL400 - Quad OP Amp Module. Four Independent Channels. It is capable of measuring all common parameters of an Op Amp,including AC as well as DC parameters.
Generic Resources
DB1600 - 16-bit Digital Card; allows for the control of 16 bit of data. The logic levels may be programmed anywhere within the range of ± 12 V
DPB8800 - 11" X 14" DUT Prototype Board; interfaces the tester with the DUT. Contains generous area for custom circuity and extra relays. Available with standard solutions to test families of components like Op-Amps, Regulators, ADC's. ± 15 V and + 5 V are available to support circuity biasing.
MATX4001 - General Purpose Relay Matrix; provides an 8 X 5 switch matrix and 4 additional Relay Drive Lines. Each relay is capable of handling 1 Amp and can isolate up to 5 KV.
MATX4010 - General Purpose Relay Matrix; provides an 8 X 5 switch matrix and 4 additional Relay Drive Lines. Each relay is capable of handling 10 Amps and can isolate up to 5 KV.
PM0650 - 6-Channel Power Source Providing 3 different supply requirements: 50 V / 2 A, 50 V / 50 mA continuous and 50 V / 2 A pulse. Floating +/- 2000 V.
PM0820 - 8 independent Power Modules on a single card. Each module has a Four-Quadrant Power Source (20 V / 100 mA). Voltage/Current, Force/Measure capabilities.
PM0825 - 8 independent Power Modules on a single card. Each module has a Four-Quadrant Power Source. 3 different supply requirements: 20 V / 500 mA, 20 V / 100 uA, 20 V / 100 mA.Voltage/Current, Force/Measure capabilities.
PM0830 - 8 independent Power Modules on a single card. Each module has a Four-Quadrant Power Source, 2 modules (30 V / 500 mA). And the other 6 modules (30 V / 50 mA). Voltage/Current, Force/Measure capabilities.
PM1000 - 1000 V / 20 mA Programmable Voltage supply. Force/Measure capabilities. Dissipation is limited to 5 W.
PM2000 - 200 V / 10 mA Programmable Voltage supply. Force/Measure capabilities to ± 10 nA accuracy.
PM2010 - Four-Quadrant Power Source (20 V / 10 A). Voltage/Current, Force/Measure capabilities. Dissipation is limited to 50 W.
SSM4010 - General Purpose Switching Matrix; provides an 8 X 5 switch matrix. Each Row/Column consists of independent Force/Sense lines that are switched simultaneously.
TMM200 - Time measurement Unit for measuring such parameters as propagation delays, rise time, fail time and any other time related parameter. It is well suited to test both digital and analog devices.

*All specifications are subject to change without notice.